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Modeling and Mitigation of Static Noise Margin Variation in Subthreshold SRAM Cells.

Nan ZhengPinaki Mazumder
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2017)
Keyphrases
  • noise model
  • signal to noise ratio
  • noise level
  • objective function
  • noisy data
  • risk management