Login / Signup

Evaluation of electrolessly deposited NiP integral resistors on flexible polyimide substrate.

Tuomas F. WarisMarkus P. K. TurunenTomi LaurilaJorma K. Kivilahti
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • electron microscopy
  • x ray
  • low energy
  • evaluation method
  • thin film
  • real time
  • website
  • case study
  • three dimensional
  • multiscale
  • lightweight
  • integrated circuit
  • evaluation process