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Evaluation of electrolessly deposited NiP integral resistors on flexible polyimide substrate.
Tuomas F. Waris
Markus P. K. Turunen
Tomi Laurila
Jorma K. Kivilahti
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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electron microscopy
x ray
low energy
evaluation method
thin film
real time
website
case study
three dimensional
multiscale
lightweight
integrated circuit
evaluation process