Interconnect yield model for manufacturability prediction in synthesis of standard cell based designs.

Hans T. Heineken Wojciech Maly

Published in: ICCAD (1996)

Keyphrases

prediction model
probabilistic model
prior knowledge
formal model
management system
database
prediction accuracy
predictive model
statistical model
mathematical model
process model
probability distribution
high level
regression model
least squares
sensitivity analysis
hidden markov models
reinforcement learning