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Determination of the stress level for voltage screen of integrated circuits.
Ramun M. Kho
A. J. Moonen
V. M. Girault
Jaap Bisschop
E. H. T. Olthof
S. Nath
Z. N. Liang
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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integrated circuit
electron beam
levels of abstraction
transmission line
real time
signal processing
higher level