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Determination of the stress level for voltage screen of integrated circuits.

Ramun M. KhoA. J. MoonenV. M. GiraultJaap BisschopE. H. T. OlthofS. NathZ. N. Liang
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • integrated circuit
  • electron beam
  • levels of abstraction
  • transmission line
  • real time
  • signal processing
  • higher level