Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes.

Mourad Oualli Christian Dua O. Patard P. Altuntas S. Piotrowicz Piero Gamarra C. Lacam J.-C. Jacquet L. Teisseire D. Lancereau Eric Chartier C. Potier Sylvain L. Delage

Published in: Microelectron. Reliab. (2018)

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