A fringing-capacitance model for deep-submicron MOSFET with high-k gate dielectric.

F. Ji J. P. Xu P. T. Lai J. G. Guan

Published in: Microelectron. Reliab. (2008)

Keyphrases

mathematical model
experimental data
theoretical analysis
computational model
conceptual model
high level
wide range
probabilistic model
probability distribution
statistical model
formal model
data sets
learning algorithm
objective function
process model
analytical model