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Stochastic Dykstra Algorithms for Metric Learning with Positive Definite Covariance Descriptors.

Tomoki MatsuzawaRaissa RelatorJun SeseTsuyoshi Kato
Published in: ECCV (6) (2016)
Keyphrases
  • metric learning
  • positive definite
  • learning algorithm
  • kernel matrix
  • machine learning
  • distance metric
  • feature space
  • multi class