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Extended Comparative Analysis of Flip-Flop Architectures for Subthreshold Applications in 28 nm FD-SOI.

Even LåteAli Asghar VatanjouTrond YtterdalSnorre Aunet
Published in: Microprocess. Microsystems (2017)
Keyphrases
  • comparative analysis
  • semi quantitative
  • silicon on insulator
  • multiple input
  • fusion scheme
  • cmos technology
  • flip flops
  • pattern recognition
  • digital images