Robust Path Delay-Fault Testability on Dynamic CMOS Circuits.

Patrick C. McGeer

Published in: ICCD (1991)

Keyphrases

power dissipation
high speed
power consumption
delay insensitive
analog vlsi
vlsi circuits
circuit design
low cost
shortest path
low power
dynamic environments
fault diagnosis
parallel processing
focal plane
low voltage
random access memory
chip design
floating gate