Variations in junction capacitance and doping activation associated with electrical stress of InGaN/GaN laser diodes.
Carlo De SantiMatteo MeneghiniS. CarraroSimone VaccariNicola TrivellinStefania MarconiMichael MarioliGaudenzio MeneghessoEnrico ZanoniPublished in: Microelectron. Reliab. (2013)