Concurrent Error Detection in Self-Timed VLSI.

David A. Rennels Hyeongil Kim

Published in: FTCS (1994)

Keyphrases

error detection
error correction
error recovery
low power
fault isolation
data cleansing
high speed
fault tolerance
signal processing
vlsi design
single chip
vlsi circuits
error resilient
error correcting
high bandwidth
error control
fuzzy logic
neural network
low cost
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