As on a 300-mm Si Substrate.

Walid Amir Dae-Hyun Kim Tae-Woo Kim

Published in: IEEE Access (2020)

Keyphrases

dielectric constant
average error
database replication
database
cross section
rms error
genetic algorithm
knowledge base
real time
steady state
simulation software
clinical setting
root mean square
magnetic recording
image guided interventions