System-to-distribution parameter mapping for the Gini index detector test statistic via artificial neural networks.
Alan L. LemesDayan A. GuimarãesYvo Marcelo C. MasselliPublished in: Comput. Electr. Eng. (2020)
Keyphrases
- test statistic
- artificial neural networks
- hypothesis testing
- likelihood ratio
- null hypothesis
- random variables
- large deviations
- distribution free
- neural network
- statistical tests
- back propagation
- normal distribution
- statistical significance
- gaussian distribution
- information theoretic
- image registration
- machine learning