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Identifying Lithography Weak-Points of Standard Cells with Partial Pattern Matching.

Yongfu LiI-Lun TsengZhao Chuan LeeValerio PerezVikas TripathiYoong Seang Jonathan Ong
Published in: ISVLSI (2018)
Keyphrases
  • pattern matching
  • string matching
  • regular expressions
  • pattern matching algorithm
  • data points
  • tree matching
  • keypoints
  • approximate pattern matching
  • matching process
  • database
  • data exchange
  • compressed text