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EllipsoNet: Deep-learning-enabled optical ellipsometry for complex thin films.

Ziyang WangYuxuan Cosmi LinKunyan ZhangWenjing WuShengxi Huang
Published in: CoRR (2022)
Keyphrases
  • deep learning
  • thin film
  • unsupervised feature learning
  • white light interferometry
  • machine learning
  • unsupervised learning
  • high density
  • feature selection
  • viewpoint
  • natural images
  • mental models