C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
EllipsoNet: Deep-learning-enabled optical ellipsometry for complex thin films.
Ziyang Wang
Yuxuan Cosmi Lin
Kunyan Zhang
Wenjing Wu
Shengxi Huang
Published in:
CoRR (2022)
Keyphrases
</>
deep learning
thin film
unsupervised feature learning
white light interferometry
machine learning
unsupervised learning
high density
feature selection
viewpoint
natural images
mental models