EllipsoNet: Deep-learning-enabled optical ellipsometry for complex thin films.

Ziyang Wang Yuxuan Cosmi Lin Kunyan Zhang Wenjing Wu Shengxi Huang

Published in: CoRR (2022)

Keyphrases

deep learning
thin film
unsupervised feature learning
white light interferometry
machine learning
unsupervised learning
high density
feature selection
viewpoint
natural images
mental models