Probabilistic gate-level power estimation using a novel waveform set method.
Saeeid Tahmasbi OskuiiPer Gunnar KjeldsbergEinar J. AasPublished in: ACM Great Lakes Symposium on VLSI (2007)
Keyphrases
- detection method
- high accuracy
- input data
- similarity measure
- experimental evaluation
- estimation accuracy
- estimation algorithm
- preprocessing
- support vector machine svm
- dynamic programming
- method finds
- parameter estimation
- small number
- cost function
- significant improvement
- computational complexity
- support vector machine
- feature set
- mutual information
- classification accuracy
- em algorithm
- clustering method
- synthetic data
- segmentation method
- objective function
- multiscale
- initial set
- data sets