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Improvements to Millimeter-Wave Dielectric Measurement Using Material Characterization Kit (MCK).

Minjie ShuXiaobang ShangNick M. RidlerAntoine R. CalleauAlexandros I. DimitriadisAnxue Zhang
Published in: IEEE Trans. Instrum. Meas. (2024)
Keyphrases
  • millimeter wave
  • radar images
  • physical phenomena
  • imaging process
  • sar imagery
  • image analysis
  • multiscale
  • machine vision
  • imaging systems