IC layout weak point effectiveness evaluation based on statistical methods.
Fang LinAli AhmadiKannan SekarYan PanKe HuangPublished in: VTS (2018)
Keyphrases
- statistical methods
- statistical analysis
- computational methods
- statistical approaches
- statistical models
- machine learning methods
- data mining techniques
- probability density function
- statistical inference
- machine learning
- evaluation model
- risk factors
- biological data
- ir evaluation
- integrated circuit
- statistical analyses
- evaluation method
- evaluation criteria
- evaluation measures
- graphical models
- data model
- computer vision