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Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology.

Li-Wei ChuChun-Yu LinShiang-Yu TsaiMing-Dou KerMing-Hsiang SongChewnpu JouTse-Hua LuJeng-Chou TsengMing-Hsien TsaiTsun-Lai HsuPing-Fang HungTzu-Heng Chang
Published in: ISCAS (2012)
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