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A State Reduction Method for Non-Scan Based FSM Testing with Don't Care Inputs Identification Technique.
Toshinori Hosokawa
Hiroshi Date
Michiaki Muraoka
Published in:
Asian Test Symposium (2002)
Keyphrases
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reduction method
finite state machines
selection algorithm
high dimensional
variable precision
data mining
feature selection
feature extraction
support vector
management system