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A State Reduction Method for Non-Scan Based FSM Testing with Don't Care Inputs Identification Technique.

Toshinori HosokawaHiroshi DateMichiaki Muraoka
Published in: Asian Test Symposium (2002)
Keyphrases
  • reduction method
  • finite state machines
  • selection algorithm
  • high dimensional
  • variable precision
  • data mining
  • feature selection
  • feature extraction
  • support vector
  • management system