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Special panel session IIB: "System validation and silicon debug - Is standardization possible?".

Mike RicchettiEric RentschlerAmit MajumdarMike LoweMark LaVineSkip LindseySharad Kumar
Published in: VTS (2016)
Keyphrases
  • low cost
  • high density
  • high speed
  • image processing
  • real world
  • genetic algorithm
  • artificial intelligence
  • liquid crystal
  • international standard