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Sinusoidal trajectory for atomic force microscopy precision local scanning with auxiliary optical microscopy.
Chih-Lieh Chen
Jim-Wei Wu
Yi-Ting Lin
Yu-Ting Lo
Li-Chen Fu
Published in:
CDC (2013)
Keyphrases
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atomic force microscopy
high precision
precision and recall
image analysis
high throughput
low cost
average precision
trajectory planning
image processing
high frequency
optical fiber
image enhancement
structured light
motion trajectories
scan data
optical imaging
trajectories of moving objects