Estimating job cycle time in a wafer fabrication factory: A novel and effective approach based on post-classification.
Toly ChenPublished in: Appl. Soft Comput. (2016)
Keyphrases
- wafer fabrication
- dispatching rule
- classification accuracy
- pattern recognition
- classification models
- classification method
- classification algorithm
- image classification
- classification process
- classification systems
- automatic classification
- machine learning
- support vector machine
- support vector
- feature selection
- text classification
- decision trees
- support vector machine svm
- preprocessing
- pattern classification
- high quality
- classification scheme
- learning algorithm
- eeg signals
- feature extraction
- feature space
- training samples
- feature vectors
- supervised learning