A Fast Method to Evaluate the Optimum Number of Spares in Defect-Tolerant Integrated Circuits.
Claude ThibeaultYvon SavariaJean-Louis HoulePublished in: IEEE Trans. Computers (1994)
Keyphrases
- detection method
- high accuracy
- integrated circuit
- significant improvement
- experimental evaluation
- probabilistic model
- classification accuracy
- theoretical analysis
- preprocessing
- high precision
- cost function
- dynamic programming
- small number
- training samples
- optimization algorithm
- clustering method
- segmentation method
- genetic algorithm