Login / Signup

Testability of 2-level AND/EXOR circuits.

Rolf DrechslerHarry HengsterHorst SchäferJoachim HartmannBernd Becker
Published in: ED&TC (1997)
Keyphrases
  • data mining
  • real time
  • knowledge base
  • image segmentation
  • high speed
  • higher level
  • levels of abstraction