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Transient stress characterization of AlGaN/GaN HEMTs due to electrical and thermal effects.

Jason P. JonesEric HellerDonald DorseySamuel Graham
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • steady state
  • electrical properties
  • infrared
  • real time
  • data sets
  • databases
  • case study
  • structuring elements
  • finite element analysis
  • electrical activity
  • equivalent circuit