Test Cost Analysis for 3D Die-to-Wafer Stacking.

Mottaqiallah Taouil Said Hamdioui Kees Beenakker Erik Jan Marinissen

Published in: Asian Test Symposium (2010)

Keyphrases

high cost
databases
neural network
data mining
information retrieval
image sequences
training data
image analysis
quantitative analysis
integrated circuit
massively parallel