A new reconfigurable Test Vector Generator for built-in self-test applications.

Samir Boubezari Bozena Kaminska

Published in: J. Electron. Test. (1996)

Keyphrases

built in self test
integrated circuit
low cost
reconfigurable architecture
general purpose
sparse matrix
data generator
social networks
neural network
case study
learning environment
feature space
clustering algorithm
data sets
hardware implementation
feature selection
software testing
pseudorandom