An Algorithm to Generate Tests for MOS Circuits at the Switch Level.
Harry H. ChenRobert G. MathewsJohn A. NewkirkPublished in: ITC (1985)
Keyphrases
- preprocessing
- objective function
- computational cost
- improved algorithm
- times faster
- detection algorithm
- dynamic programming
- experimental evaluation
- particle swarm optimization
- generation method
- single pass
- theoretical analysis
- worst case
- np hard
- computational complexity
- cost function
- high accuracy
- search space
- recognition algorithm
- k means
- matching algorithm
- tree structure
- clustering method
- significant improvement
- optimization algorithm
- computationally efficient
- segmentation algorithm
- convergence rate
- expectation maximization
- learning algorithm
- high speed
- similarity measure