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2˟VDD 500 MHz Digital Output Buffer with Optimal Driver Transistor Sizing for Slew Rate Self-adjustment and Leakage Reduction Using 28-nm CMOS Process.

Chua-Chin WangPang-Yen LouTsung-Yi TsaiYan-You ChouTzung-Je Lee
Published in: Circuits Syst. Signal Process. (2021)
Keyphrases
  • high speed
  • buffer allocation
  • metal oxide semiconductor
  • real time
  • circuit design
  • buffer size
  • optimal solution
  • computational complexity
  • worst case
  • integrated circuit
  • asymptotically optimal