Determining the low-frequency noise source in cryogenic operation of short-channel bulk MOSFETs.
Takumi InabaHiroshi OkaHidehiro AsaiHiroshi FuketaShota IizukaKimihiko KatoShunsuke ShitakataKoichi FukudaTakahiro MoriPublished in: VLSI Technology and Circuits (2023)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- noisy channel
- subband
- wavelet analysis
- wavelet coefficients
- discrete wavelet transform
- contourlet transform
- low pass
- dct domain
- frequency band
- high frequency components
- original images
- machine learning
- subband decomposition
- multiresolution
- wavelet domain
- spatial domain
- low and high frequency