Test Pattern Generators for Distributed and Embedded Built-in Self-Test at Register Transfer Level.
Vlado VorisekPublished in: ISQED (2001)
Keyphrases
- built in self test
- distributed systems
- pattern matching
- distributed environment
- cooperative
- multi agent
- peer to peer
- communication cost
- levels of abstraction
- higher level
- computer networks
- distributed computing
- integrated circuit
- lightweight
- fault tolerant
- pattern discovery
- distributed data
- communication overhead
- real time embedded