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Failure Localization of Logic Circuits Using Voltage Contrast Considering State of Transistors.
Masafumi Nikaido
Yukihisa Funatsu
Tetsuya Seiyama
Junpei Nonaka
Kazuki Shigeta
Published in:
Asian Test Symposium (2013)
Keyphrases
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logic circuits
low power
state space
power consumption
case study
real time
image processing
pattern recognition
low cost
power system
high density