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Investigation of Inverse Piezoelectric Effect and Trap Effect in AlGaN/GaN HEMTs Under Reverse-Bias Step Stress at Cryogenic Temperature.
Qing Zhu
Xiaohua Ma
Bin Hou
Mei Wu
Jie-Jie Zhu
Ling Yang
Meng Zhang
Yue Hao
Published in:
IEEE Access (2020)
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