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Simulation of total dose influence on analog-digital SOI/SOS CMOS circuits with EKV-RAD macromodel.

Konstantin O. PetrosyantsIgor A. KharitonovLev M. SamburskyV. N. BogatyrevZ. M. PovarnitcynaE. S. Drozdenko
Published in: EWDTS (2013)
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