Sign in

In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops.

Sarah AzimiCorrado De SioLuca Sterpone
Published in: IOLTS (2020)
Keyphrases
  • flip flops
  • cmos technology
  • multiple input
  • high speed
  • power dissipation
  • neural network
  • video sequences
  • event detection
  • risk management
  • multi channel
  • image processing algorithms