In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops.

Sarah Azimi Corrado De Sio Luca Sterpone

Published in: IOLTS (2020)

Keyphrases

flip flops
cmos technology
multiple input
high speed
power dissipation
neural network
video sequences
event detection
risk management
multi channel
image processing algorithms