A deterministic-dither-based, all-digital system for on-chippower supply noise measurement.
Kannan A. SankaragomathiWilliam Anthony SmithBrian P. OtisVisvesh S. SathePublished in: ISLPED (2014)
Keyphrases
- measurement error
- black box
- noise reduction
- noisy data
- random noise
- image noise
- noise model
- missing data
- signal to noise ratio
- distribution networks
- median filter
- transform domain
- digital libraries
- weak signal detection
- noise free
- noise sensitivity
- inverse halftoning
- low signal to noise ratio
- digital content
- neural network
- noise level
- low frequency
- high frequency
- digital images
- image processing