Circular BIST testing the digital logic within a high speed Serdes.
Graham HetheringtonRichard SimpsonPublished in: ITC (2003)
Keyphrases
- high speed
- built in self test
- logic programming
- low power
- modal logic
- digital curves
- digital content
- hough transform
- automated reasoning
- classical logic
- predicate logic
- high speed networks
- proof theory
- test set
- frame rate
- low cost
- databases
- logical framework
- multimedia
- linear logic
- sound and complete axiomatization
- learning algorithm