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Classification of Segmented Regions in Brightfield Microscope Images.

Marko TscherepanowFrank ZöllnerFranz Kummert
Published in: ICPR (3) (2006)
Keyphrases
  • microscope images
  • segmented regions
  • support vector machine svm
  • cross sections
  • feature selection
  • feature space
  • support vector machine
  • image classification
  • feature extraction
  • image data
  • ground truth