Reliability of ICA attachment of SMDs on inkjet-printed substrates.
Juha NiittynenJanne KiilunenJussi PutaalaVille PekkanenMatti MäntysaloHeli JantunenDonald LupoPublished in: Microelectron. Reliab. (2012)
Keyphrases
- independent component analysis
- face recognition
- preprocessing
- signal processing
- independent components
- principal component analysis
- thin film
- mathematical expressions
- information retrieval
- image processing
- feature extraction
- factor analysis
- high density
- software reliability
- independent components analysis
- blind source separation