• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

A new march sequence to fit DDR SDRAM test in burst mode.

André Borin SoaresAlexsandro Cristovão BonattoAltamiro Amadeu Susin
Published in: SBCCI (2008)
Keyphrases
  • long sequences
  • test cases
  • data sets
  • artificial intelligence
  • decision making
  • multiscale
  • reinforcement learning
  • artificial neural networks
  • statistical significance