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A new march sequence to fit DDR SDRAM test in burst mode.

André Borin SoaresAlexsandro Cristovão BonattoAltamiro Amadeu Susin
Published in: SBCCI (2008)
Keyphrases
  • long sequences
  • test cases
  • data sets
  • artificial intelligence
  • decision making
  • multiscale
  • reinforcement learning
  • artificial neural networks
  • statistical significance