Mixed particle Monte Carlo method for deep submicron semiconductor device simulator.
Gyo-Young JinYoung-June ParkHong-Shick MinPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1991)
Keyphrases
- monte carlo method
- semiconductor devices
- markov chain
- electron beam
- monte carlo
- genetic algorithm
- posterior distribution
- bayesian learning
- maximum likelihood estimation
- field effect transistors
- learning machines
- mathematical models
- parameter estimation
- learning algorithm
- latent variables
- markov chain monte carlo
- model selection
- generalized gaussian
- image segmentation