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Statistical degradation analysis of digital CMOS IC's.
Venkata S. Rangavajjhala
Bharat L. Bhuva
Sherra E. Kerns
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1993)
Keyphrases
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statistical analysis
databases
data analysis
mathematical analysis
data mining
computer vision
metadata
low cost
quantitative analysis
integrated circuit
contingency tables
descriptive statistics