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The effects of buffer thickness on GaAs MESFET characteristics: channel-substrate current, drain breakdown, and reliability.
Frank Gao
Ravi Chanana
Tom Nicholls
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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field effect transistors
semiconductor devices
steady state
high density
data sets
data structure
mathematical analysis
genetic algorithm
information systems
database systems