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A simplified yield modeling method for design rule trade-off in interconnection substrates.

Michael SchefflerDidier CottetGerhard Tröster
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • modeling method
  • trade off
  • high density
  • hybrid genetic
  • computational intelligence
  • design process
  • pattern recognition
  • association rules
  • control system