Optimal "Anti-Bayesian" Parametric Pattern Classification for the Exponential Family Using Order Statistics Criteria.
Anu ThomasB. John OommenPublished in: ICIAR (1) (2012)
Keyphrases
- order statistics
- pattern classification
- exponential family
- median filter
- pattern recognition
- feature extraction
- maximum likelihood
- window size
- piecewise linear
- closed form
- image processing
- dynamic programming
- mixture model
- data sets
- high dimensional data
- sampling algorithm
- random sampling
- bayesian inference
- statistical models
- dimensionality reduction
- bayesian networks
- image segmentation
- neural network