A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits.
Christopher MichaelChristopher J. AbelC. S. TengPublished in: ICCAD (1993)
Keyphrases
- statistical model
- integrated circuit
- analog vlsi
- statistical models
- circuit design
- metal oxide semiconductor
- cmos image sensor
- power consumption
- focal plane
- statistical distribution
- facial shape
- mixed signal
- low power
- high speed
- printed circuit boards
- electron beam
- image analysis
- active appearance models
- floating gate
- image sensor
- image processing
- signal processing
- high resolution
- face recognition
- three dimensional