A fully physical model for leakage distribution under process variations in Nanoscale double-gate CMOS.

Hari Ananthan Kaushik Roy

Published in: DAC (2006)

Keyphrases

computational model
mathematical model
probabilistic model
process model
conceptual model
theoretical framework
formal model
physical processes
high level
similarity measure
probability distribution
high speed
low power
gaussian distribution
recognition process
circuit design