A one-model approach to classification and sensitivity analysis in DEA.
Gholam Reza JahanshahlooF. Hosseinzadeh LotfiN. ShojaGhasem TohidiShabnam RazavyanPublished in: Appl. Math. Comput. (2005)
Keyphrases
- sensitivity analysis
- managerial insights
- influence diagrams
- high level
- pattern recognition
- decision trees
- classification models
- pattern classification
- image classification
- classification accuracy
- feature vectors
- feature extraction
- probability distribution
- classification method
- closed form
- probabilistic model
- prior knowledge
- variational inequalities
- feature selection