Measurement of C and tanδ of a capacitor employing PSDs and dual-slope DVMs.

V. Jagadeesh Kumar P. Sankaran K. Sudhakara Rao

Published in: IEEE Trans. Instrum. Meas. (2003)

Keyphrases

data acquisition
bayesian network classifiers
primal dual
measurement model
neural network
real world
e learning
bayesian networks
graphical models
transmission line
short circuit